Considerations on a laser-scanning-microscope with high resolution and depth of field.

نویسندگان

  • C Cremer
  • T Cremer
چکیده

In conventional light microscopy, the depth of focus is severely limited. This limitation might be overcome by a light optical scanning procedure. In this procedure, the specimen surface is scanned point for point by a focused laser beam. The image of the specimen surface is generated by an electronic system, similar to the procedure used in the scanning electron microscope. Possibilities to develop a "laser-scanning-microscope" on the basis of available techniques (laser microirradiation, miniprocessors, light detecting systems, automatic focusing, holographic focusing etc.) are discussed. On account of its possibility to form images of high resolution and depth of focus, a laser-scanning-microscope might become a valuable tool in addition to conventional light microscopy and scanning electron microscopy.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

متن کامل

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

The effect of surface roughness on 1050 aluminum alloy weld profile welded by pulsed Nd:YAG laser

Surface roughness in the welding processes is one of the important parameters in the laser welded metal connections which affects laser beam absorption directly. When the laser beam is irradiated to the surface of the base metal, the surface roughness plays an important role in the amount of beam absorption and the amount of melting achieved and directly affects the penetration depth. The main ...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:
  • Microscopica acta

دوره 81 1  شماره 

صفحات  -

تاریخ انتشار 1978